ATE Applications For Embedded Systems
E-Metric's Excellence in ATE for Embedded Systems Testing
In the fast-paced, ever-evolving field of embedded systems, testing the reliability and performance of large volume manufactured products is crucial. E-Metric Technology stands out as a dependable technology provider of Automated Test Equipment (ATE) solutions for embedded systems.
With deep design experience and application expertise, we ensure that embedded systems are tested for functionality, quality, and industrial compliance. Whether developing with popular 32-bit microprocessors (MPU) or sophisticated System-on-Chips (SoCs), E-Metric Technology has the solutions you need to excel.
E-Metric Technology : The Go-To Partner for Automated Embedded Systems Testing
Specialized ATE Solutions for Embedded Systems
E-Metric Technology is renowned for ATE designs tailored for testing embedded systems. Our advanced testing platforms address the unique challenges of embedded systems testing, ensuring comprehensive validation of both hardware and firmware.
From electrical functional testing to peripheral I/O validation, our solutions cover major aspects of embedded systems.
Expertise with Embedded Microprocessors
We have extensive experience working with various 32-bit embedded processor families:
| ARM Cortex-M Popular for its low-power consumption and real-time performance, ARM Cortex-M series is widely used in applications ranging from consumer electronics to industrial control. E-Metric Technology’s ATE solutions ensure thorough testing of these processors, verifying functionality and performance under diverse conditions. | Intel/Altera Nios II Nios II is known for its flexibility and customization options in FPGA-based systems. Our testing solutions for Nios II processors focus on validating both the hardware and firmware, ensuring reliable operation in complex embedded systems. | Microchip PIC32 Renowned for its integration and ease of use, PIC32 MCU family is common in automotive, industrial, and consumer applications. E-Metric Technology provides targeted testing automation for PIC32 MCU, addressing key aspects such as power consumption and peripheral functionality. |
Expertise with System-On-Chips
E-Metric Technology also offers ATE solutions for testing sophisticated System-on-Chips (SoCs) used in advanced embedded applications.
Common SoCs we support:
| Qualcomm Snapdragon Widely used in mobile devices and automotive applications, Snapdragon SoCs require rigorous testing to ensure performance and reliability. E-Metric Technology’s ATE solutions provide thorough validation of Snapdragon SoCs, addressing performance metrics, connectivity, and power management. | NVIDIA Jetson The Jetson series is popular in AI and machine learning (ML) applications, requiring extensive testing to validate computing performance and GPU functionalities. Our ATE solutions ensure that Jetson SoCs meet the demanding requirements of AI-driven applications. | Texas Instruments Sitara Known for its versatility in industrial and automotive applications, Sitara SoC family requires comprehensive testing to verify real-time control responses and peripheral integration. E-Metric Technology provides specialized real-time ATE solutions for Sitara SoCs, ensuring reliable operation in mission-critical environments. |
- Comprehensive SoC Testing Standards
To handle the intrinsic complexities of SoCs, our ATE solutions incorporate the best available established SoC testing standards in the industry:
| IEEE 1500 (Embedded Core Test Standard) | Developed specifically for testing embedded analog, digital, or mixed-signal cores within SoCs, using a testing architecture around the cores. E-Metric Technology's ATE solutions incorporate IEEE 1500-compatible standard wrapper interface, enabling easy isolated testing of individual cores without affecting other sub-systems, particularly useful for multi-core SoCs. | |
| IEEE 1450 (Standard Test Interface Language, STIL) | STIL as a standardized language, defines test data and patterns for digital SoCs, and used for Test Pattern Generation and simulation in SoC test environments. E-Metric Technology's ATE solutions support a STIL development framework, enabling the standardization of test pattern formats, and making it consistent to share test data across different tools and platforms. | |
| IEEE 1801 (Unified Power Format, UPF) | Used in SoC design and testing to describe the power intent, this newest standard is actively being upgraded to Version 2. E-Metric Technology's ATE designs have built-in support for IEEE-1801-compatible power management testing interface, ensuring the SoC's power architecture can be tested for power domains, voltage levels, and power states to match design specifications. Particularly suitable for designs implementing power gating, multi-power domains, Dynamic Voltage Scaling (DVS), and Ultra-Low-Power (ULP) applications. | |
| IEEE 1149.6 (Advanced Boundary Scan Standard) | An extension of the standard IEEE 1149.1 JTAG for testing AC-coupled and differential signal paths, commonly used by modern SoCs. E-Metric Technology's ATE technology portfolio includes IEEE 1149.6 test modules, allowing the testing of Signal Integrity (SI) of high-speed PHY such as LVDS and LVPECL transceivers - the underlying physical layers of common digital interfaces from PCI-e to HDMI. | |
| IEEE 1800 (SystemVerilog Standard)__ | The standard hardware description language for SoC design and verification. E-Metric Technology's ATE solutions have interfacing channels with SystemVerilog IDE to execute testbenches and verification IPs, for simulation and emulation-based functional testing of SoCs before physical implementation. | |
The standard testing frameworks allow our ATEs to address key areas of testing advanced SoCs, including multiple-core processing unit, application-specific hardware accelerators and co-processors, integrated peripherals, and specialized I/O interfaces.
Cutting-Edge Automated Testing Technologies
E-Metric Technology employs the latest advancements in Electronic Test & Measurement technology to deliver high-precision testing for embedded systems. Our solutions feature real-time monitoring systems, automated testing workflows, and sophisticated test pattern generation, ensuring that embedded systems are rigorously validated to industry standards.
- Tailored Solutions for Diverse Applications
Embedded systems span a wide range of applications, from consumer electronics to automotive control. E-Metric Technology provides customized ATE solutions that cater to the specific application area of your embedded systems, ensuring that each system is tested thoroughly and effectively.
- Proven Industry Expertise
With a track record of successful projects across various industries, E-Metric Technology is a trusted leader in ATE for embedded systems. Our expertise and commitment to excellence ensure that your testing processes are streamlined, efficient, and capable of delivering accurate results.
Experience the E-Metric Difference
For OEMs and developers seeking top-tier ATE solutions for embedded systems, E-Metric Technology is the ideal partner. Our specialized expertise and advanced technologies ensure that your embedded systems are tested to the highest standards of performance and reliability.
Contact us today to discover how our ATE solutions can unlock the full potential of your embedded systems testing capabilities. Partner with us to experience unparalleled excellence and drive success in your industry.